Using the LatticeAx to Downsize Samples Prior to SEM Examination

[vc_row][vc_column][vc_column_text]Using the LatticeAx to Downsize Samples Prior to Examination in A SEM With Height Restrictions[/vc_column_text][/vc_column][/vc_row][vc_row][vc_column width=”1/2″ offset=”vc_col-lg-offset-0″][vc_row_inner][vc_column_inner][vc_column_text]

[/vc_column_text][/vc_column_inner][/vc_row_inner][vc_cta h2=”How do you consistently prepare samples for SEMS with height restrictions?” h2_font_container=”font_size:22″ h2_use_theme_fonts=”yes” h4=”-Use the LatticeAx!” h4_font_container=”font_size:16″ h4_use_theme_fonts=”yes” add_button=”left” btn_title=”Contact” btn_color=”danger” btn_size=”sm” btn_add_icon=”true” btn_link=”url:https%3A%2F%2Flatticegear.com%2Fcontact-latticegear%2F||target:%20_blank” use_custom_fonts_h2=”true” use_custom_fonts_h4=”true”][/vc_cta][/vc_column][vc_column width=”1/2″][vc_empty_space][vc_column_text]We commonly get inquiries about how to cleave small samples. Often the application is for downsizing of the sample prior to examination in a high resolution scanning electron microscope (SEM). LatticeGear has developed a simple, repeatable method that keeps the cross section face clean. Watch the video to see how it is done.[/vc_column_text][vc_row_inner][vc_column_inner][vc_video link=”https://youtu.be/87NQsShQ4v8″][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row]