Category Archives: Uncategorized

LatticeGear is heading to Semicon SEA to participate in the workshop: Effective Failure Analysis in the age of Internet-of-Things (IoT) chaired by Dr. GOH Szu Huat of Global Foundries, Singapore Pte Ltd. Learn more about the workshop and register here https://lnkd.in/eaXPYN3 Here is the conference abstract: In today’s age of IoT proliferation, people are more […]

Some analytical instruments can only accept small samples and with limited height. Sample preparation by scribing and cleaving is often the best solution. LatticeGear’s scribing and cleaving tools are used to prepare narrow samples for high resolution SEM and STEM. The video shows two methods of preparing 1 mm wide strips. One narrow sample was […]

Have you had trouble cleaving small samples? LatticeGear introduces our Small Sample Cleaving Pliers and Scribing and Cleaving Kit for Small Samples. The custom handheld cleaving pliers can cleave samples into pieces from 1 – 30 mm with soft nylon covered jaws that do not damage your sample. These new accessories can be purchased on […]

The LatticeAx was a key component of the sample preparation workflow for preparing copper C4 bumps for examination in the SEM. The results revealed the bump-metallization interface. The process was more cost effective and could be achieved much faster in comparison to using a focused ion beam (FIB) instrument. Read More

The LatticeAx supported a discovery that Dr. Suchitra Sebastian of the University’s Cavendish Laboratory and her team of PhD students weren’t expecting. Read More